« All Events

MSNO – Microscopy Summer School

August 12 - August 14

2026 MSNO MICROSCOPY SUMMER SCHOOL

August 13, 2026 (Thursday)
​Online lecturesAugust 12 and 14, 2026 (Friday)
In-person lab demonstration and hands-on experiences at AMLCI/Kent State and Swagelok Center at Case Western Reserve.

​

REGISTRATION LINK: THE EVENT IS FREE, BUT PLEASE REGISTER EARLY IF YOU WANT TO SECURE A SPOT FOR IN-PERSON DEMOS. 

An important reminder: ​If you have registered for the Summer School but have not received an email confirmation from Min Gao in a few hours, your registration may not have gone through successfully. Please contact mgao@kent.edu directly.

ONLINE LECTURES: SCHEDULE, TITLES, AND SPEAKERS

We have four experienced electron microscopists with diverse backgrounds and expertise. Each lecture will include approximately 15 minutes of dedicated Q&A time, so please feel free to bring your questions—we’d love to hear them!
August 13 (online, link will be sent to you before the event)

9:30 – 11:00: “Transmission Electron Microscopy (TEM) and its Applications” Dr. Kai Sun, University of Michigan

This talk will cover TEM basic optics (CTEM, STEM and EFTEM), conepts, techniques and their applications in a broad range of science and engineering research. Some recent developments in TEM (like 4D-STEM, UEM and ETEM) will also be addressed.

11:15 – 12:15: “Basics of Image Processing in Electron Microscopy”, Dr. Kimberly Fraser née Gliebe, The Lubrizol Corporation

We will be looking at different ways image analysis can be applied to microscopy images.  There will be focused demonstrations using ImageJ and Python for segmentation techniques. and discussions regarding when different image analysis techniques are most beneficial.

​13:30 – 14:30: “TEM Sample Preparation Using a Focused Ion Beam (FIB): From Bulk Material to an Electron-Transparent Lamella“, Dr. Tugce Karakulak Uz, Case Western Reserve University

This talk provides an introduction to TEM sample preparation using a Focused Ion Beam (FIB). It explores why TEM requires electron-transparent specimens, how a DualBeam FIB-SEM enables site-specific sample preparation, and the essential workflow from region selection to a TEM-ready lamella. Common preparation artifacts, practical considerations, and representative applications are also discussed. 

14:45 – 16:15: ​”Basics of TEM specimen preparation with a focus on cryo-based techniques”, Dr. Min Gao, Kent State University

We will cover basic sample preparation methods for a variety of hard materials (metals, ceramics, semiconductors, etc.) and soft materials (polymers, liquid crystals, biological materials, etc.). Cryogenic techniques, including plunge freezing, high-pressure freezing, freeze-fracture, cryo-ultramicrotomy, etc. will also be discussed.

August 12 and 14 (In-Person Demonstration)
Demonstration schedule will be determined based on registration. Schedule and parking information will be sent to you before your visit. 
TEM/SEM Labs at Kent State University (Dr. Min Gao)
FIB/SEM labs at Case Western Reserve University (Dr. Tugce Karakulak Uz)
Contact Min (mgao@kent.edu) and Tugce (txk472@case.edu) for questions. 

Details

Organizer